• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
  • 同族专利
  • 引用文献
  • 法律状态
  • 优先权
    • 专利摘要:
    A first resistor (R1) dedicated to the measurement of low currents and a second resistor (R2) dedicated to the measurement of high currents are arranged in series with a voltage source (S1). When the current drawn by the active load exceeds a current threshold corresponding to the maximum allowable voltage drop across the first resistor (R1), a current is supplied to the node (NC) common to the two resistors so as to stabilize the voltage at the terminals of the active load to a threshold value. And in the presence of such strong currents, the current consumed by the active load can be measured at the level of the second resistor (R2).
    公开号:FR3056299A1
    申请号:FR1658679
    申请日:2016-09-16
    公开日:2018-03-23
    发明作者:Patrick Almosnino
    申请人:STMicroelectronics Alps SAS；
    IPC主号:
    专利说明:

    056 299
    58679 ® FRENCH REPUBLIC
    NATIONAL INSTITUTE OF INDUSTRIAL PROPERTY © Publication number:
    (only to be used for reproduction orders) © National registration number
    COURBEVOIE © Int Cl 8 : G 01 R 19/00 (2017.01)
    PATENT INVENTION APPLICATION
    A1
    (© Date of filing: 16.09.16. © Applicant (s): STMICROELECTRONICS (ALPS) (© Priority: SAS Simplified joint stock company - FR. @ Inventor (s): ALMOSNINO PATRICK. (© Date of public availability of the request: 23.03.18 Bulletin 18/12. (© List of documents cited in the report of preliminary research: Refer to end of present booklet (© References to other national documents ® Holder (s): STMICROELECTRONICS (ALPS) SAS related: Joint stock company. ©) Extension request (s): (© Agent (s): CASALONGA.
    164) METHOD FOR DETERMINING THE CONSUMPTION DURING THE CURRENT OF AN ACTIVE CHARGE, FOR EXAMPLE A PROCESSING UNIT, AND RELATED ELECTRONIC CIRCUIT.
    FR 3 056 299 - A1 _ There is in series with a voltage source (S1) a first resistor (R1) dedicated to the measurement of low currents, and a second resistor (R2) dedicated to the measurement of high currents.
    When the current drawn by the active load exceeds a current threshold corresponding to the maximum admissible voltage drop across the first resistor (R1), a current is delivered to the node (NC) common to the two resistors so as to stabilize the voltage across the active load to a threshold value. And in the presence of such strong currents, the current consumed by the active load can be measured at the second resistor (R2).
    Method for determining the current consumption of an active load, for example a processing unit, and associated electronic circuit
    Embodiments and embodiments of the invention relate to electronic circuits and especially those used for measuring the current consumption of an active load, for example a processing unit.
    Conventionally, it is possible to measure the current consumption of an electronic device by measuring the voltage across a resistor coupled for example between a voltage source and the processing unit. These resistors are generally coupled to an operational amplifier which outputs the voltage across the resistance.
    However, some applications require the use of active loads, for example processing units, consuming a current whose value can vary very greatly for a very short time. For example, it is possible that a processing unit consumes a current with an average value of 0.3 micro-amperes for several seconds, then, due to the implementation of a specific operation, consuming a current of 3 milliamps for 0.5 milliseconds
    Thus, it is necessary to be able to measure a current having a wide dynamic range, with a large frequency so as not to miss the measurement of very brief events, such as peaks in current consumption.
    It is currently not possible to make such measurements with a simple resistor coupled to an amplifier. Indeed, amplifiers capable of operating at high frequencies generate too much noise to be suitable for measuring very low current.
    There are also means comprising two resistors each coupled to an amplifier, one dedicated to the measurement of weak currents, the other to the measurement of strong currents, and a switching system making it possible to read the voltage on Tune or the other of the two resistances; However, the transition is not done quickly enough and some samples may be lost during switching.
    It is therefore proposed here a method and a measuring device allowing the measurement at a high frequency of a current consumed by an active load, for example a processing unit such as a microprocessor or a microcontroller, consuming a current having a high dynamic range. According to one aspect, there is provided a method for determining the value of a current consumed by an active load, for example a processing unit, supplied by a first voltage source (for example 3 volts), in which
    - there is a first resistor and a second resistor in series between the voltage source and a first terminal of the active load, the first resistor having a value (for example 1000 Ohms) greater than that of the second resistor (for example (2 Ohms),
    - a maximum admissible voltage drop is defined (for example 100 mV, corresponding taking into account the value of the first resistance to a maximum admissible current here of 100 microamps) at the terminals of the first resistance and if the voltage at the first terminal is lower than a threshold value (for example 2.9 Volts) equal to the value of the voltage delivered by said first voltage source reduced by said admissible voltage drop, the voltage at the first terminal of the active load is stabilized at the threshold value,
    a first potential difference across the first resistance and a second potential difference across the second resistance are measured simultaneously,
    - if the first potential difference is less than said maximum admissible voltage drop, the value of the current consumed is determined from the first potential difference
    - And if the voltage is greater than or equal to said maximum admissible voltage drop, the value of the current consumed is determined from the second potential difference.
    Thus according to this aspect, there is in series with a voltage source a first resistor dedicated to the measurement of low currents, and a second resistor dedicated to the measurement of high currents.
    The low currents drawn by the active load can be measured by the first resistance delivering to these terminals a readable potential difference compared to the potential difference at the terminals of the second resistance.
    The voltage across the active load drops when the current increases, mainly due to the voltage drop across the first resistor.
    When the current drawn by the active load exceeds a current threshold (for example 100 microamperes) corresponding to the maximum admissible voltage drop (for example 100 mV) across the terminals of the first resistance (1000 Ohms), a current is delivered to the node common to the two resistors so as to stabilize the voltage across the active load at the threshold value (for example 2.9 Volts). And in the presence of such strong currents, the current consumed by the active load can be measured at the second resistor.
    We can thus measure both strong currents and weak currents. Low currents are measured at the first resistance with a sensitivity N times greater than that which would be at the second resistance, N being the ratio between the value of the first resistance and the value of the second resistance.
    Furthermore, the simultaneous measurement of the two potential differences across the two resistors makes it possible to avoid any switching and therefore loss of samples.
    The ratio N between the values of the two resistances depends on the intended application and on the desired sensitivity.
    This being for information it is preferable so as to be able to effectively measure the current consumed that the ratio between the value of the first resistance and the value of the second resistance is between 100 and 1000.
    According to one mode of implementation, the voltage at the first terminal of the active load is stabilized by comparing said voltage with said threshold value and by injecting into the node common to the two resistors a current proportional to the difference between the threshold value and the value of said voltage.
    According to another aspect, an electronic circuit, for example an integrated circuit, is proposed, comprising an input terminal intended to be connected to a first voltage source, an output terminal intended to be connected to an active load and processing means. configured to determine a current consumed at said output terminal.
    The means of treatment include
    a first resistor and a second resistor connected in series between the input terminal and the output terminal, the first resistor having a value greater than that of the second resistor,
    first measurement means and second measurement means respectively configured to simultaneously measure a first potential difference across the first resistance and a second potential difference across the second resistance,
    stabilization means configured to stabilize the voltage at the output terminal at a threshold value equal to the value of the voltage delivered by said first voltage source reduced by a maximum admissible voltage drop across the terminals of the first resistor, if the voltage at the output terminal is less than said threshold voltage, and
    determination means configured to determine the current consumed at the output terminal from the first potential difference if the first potential difference is less than said maximum admissible voltage drop and from the second potential difference if the first potential difference is greater than or equal to said maximum allowable voltage drop.
    According to one embodiment, the stabilization means comprise comparison means configured to compare said voltage present at the output terminal with said threshold value and additional means configured to inject into the node common to the two resistors a current proportional to the difference between the value of the voltage present at the output terminal and said threshold value.
    The comparison means can comprise a differential amplifier, the inverting input of which is connected to the output terminal, the non-inverting input of which is intended to receive said threshold value, the additional means can comprise a transistor, the control electrode of which is coupled to the output of the differential amplifier, a first conduction electrode of which is connected to an additional voltage source and a second conduction electrode of which is coupled to said node common to the two resistors.
    The differential amplifier is then advantageously configured to, when the voltage present at the output terminal is greater than or equal to the threshold voltage, deliver an output voltage leading to a blocking of said transistor.
    According to one embodiment, the ratio between the value of the first resistance and the value of the second resistance is between 100 and 1000.
    According to one embodiment,
    the first measurement means comprise a first operational amplifier whose inputs are coupled to the terminals of the first resistance,
    the second measurement means comprise a second operational amplifier whose inputs are coupled to the terminals of the second resistor, and
    the determination means comprise two analog / digital converters respectively connected at the output of the first and second measurement means, and a processing module configured to compare the output of the first measurement means with said maximum admissible voltage drop and to select the samples delivered by the corresponding converter according to the result of said comparison.
    The output terminal may be intended to be connected to a processing unit forming said active load.
    Other advantages and characteristics of the invention will appear on examining the detailed description of modes of implementation and embodiments, in no way limiting, and the appended drawings in which:
    - Figure 1 schematically illustrates an embodiment of the invention, and
    - Figures 2 and 3 illustrate modes of implementation of the method according to the invention
    FIG. 1 schematically illustrates from an electrical point of view an electronic circuit CE according to an embodiment of the invention.
    The circuit CE comprises an input terminal BE and an output terminal BS coupled to a first terminal Bl of an active load, here processing unit UT, for example a microprocessor. The circuit CE is configured to determine the current consumed Is by the processing unit UT.
    The processing unit UT is here able to consume a current whose value can vary by a factor of ten thousand, for example here in a dynamic range going from 100 nano-amps to 10 milliamps.
    The circuit includes a first voltage source SI coupled to the input terminal and configured to supply the processing unit UT with a voltage VI. Here, the first voltage source VI supplies a voltage VI of 3 volts.
    Two resistors RI and R2 are coupled in series between the input terminal BE and the output terminal BS. The resistance RI to a value much higher than the value of the resistance R2. For example here, the first resistor R1 and the second resistor R2 have values of 1000 ohms and 2 ohms respectively.
    The circuit CE also includes first measurement means 1, configured to measure a first potential difference across the terminals of the first resistance RI. The first measurement means 1 here comprise a first differential amplifier 10 (produced here with operational amplifiers), the two inputs of which are coupled to the terminals of the first resistor RI.
    The circuit CE also includes second measurement means 2, configured to measure a second potential difference across the second resistor R2. The second measurement means 1 here comprise a second differential amplifier 20 (produced here with operational amplifiers), the two inputs of which are coupled to the terminals of the second resistor R2.
    The two measuring means measure the two potential differences simultaneously and continuously.
    The circuit CE further comprises stabilization means 3 configured to stabilize the voltage BS at the output terminal BS at a threshold value VR equal to the value of the voltage VI delivered by said first voltage source SI minus a drop of maximum admissible voltage Vd at the terminals of the first resistance RI, if the voltage VS at the output terminal is less than said threshold voltage VR.
    When the processing unit LT is in operation, it can perform operations which require the consumption of a current ls. Depending on the operation, the current consumed ls is more or less important, and can vary for example between 100 nanoamps and 10 milliamps.
    The flow of current ls through the first resistor RI and the second resistor R2 causes an increase in the voltage across the terminals thereof, and therefore a voltage drop equivalent to the terminals of the processing unit LT. The resistance RI, because of its value much higher than the value of the resistance R2, is mainly responsible for this voltage drop.
    However, an excessive drop in voltage can hinder the proper functioning of the processing unit.
    Thus, a threshold voltage VR is fixed below which the voltage VS at the terminals of the processing unit must not fall.
    For example here, the threshold voltage is fixed at 2.9 volts, that is to say that one seeks to avoid a voltage drop Vd greater than 0.1 volts at the terminals of the processing unit and therefore across the terminals of the first resistance RI which is mainly responsible for it. This maximum admissible value Vd of voltage drop across the first resistor RI here corresponds to a threshold current equal to 100 microamps.
    The circuit CE thus also comprises stabilization means 3 configured for, if the voltage VS at the output terminal is less than said threshold voltage VR, stabilize the voltage BS at the output terminal BS at the threshold value VR equal to the value of the voltage VI delivered by said first voltage source SI minus the maximum admissible voltage drop Vd across the terminals of the first resistor RI.
    The stabilization means 3 here comprise comparison means 5 configured to compare said voltage VS present at the output terminal BS with said threshold value VR and additional means 50 configured to inject a current into the common node NC to the two resistors RI and R2 proportional to the difference between the value of the voltage VS present at the output terminal and said threshold value VR.
    The comparison means comprise a differential amplifier 5, the input "-" of which is coupled to a second voltage source SR delivering the threshold voltage VR (equal to VI - Vd).
    The "+" input of the differential amplifier is coupled to the output of a follower amplifier 4, the "+" input of which is coupled to the BS output terminal.
    The additional means comprise a third resistor R3 coupled to the base (control electrode) of a transistor, here a bipolar transistor TR, of which a first conduction electrode is coupled to an additional voltage source S3 delivering a voltage V3, and of which a second conduction electrode is coupled to the anode of a diode Dl ..
    The cathode of the diode Dl is coupled to the common node NC.
    The role of the resistor R3 is to protect the transistor TR against overcurrents.
    The differential amplifier 5 is configured, here by its large gain, for example 200, for, when the voltage present at the output terminal BS is greater than or equal to the threshold voltage VR, deliver an output voltage leading to a blocking of said transistor TR.
    More precisely, if the voltage VS, copied over the inverting input of the differential amplifier 5 by the follower amplifier 4, is between the voltage VI and the threshold voltage VR, which corresponds to a low current drawn by the load, the amplifier 5 delivers, due to its high gain, a very low, or almost zero, output voltage, blocking the transistor TR. No current is then injected into the common node.
    If the voltage VS becomes lower than the threshold voltage VR, which corresponds to a strong current drawn by the load, the amplifier 5 then delivers a positive output voltage on the base of the transistor, ίο sufficient to allow it to deliver a current proportional to the voltage present on its base and therefore to the difference VS-VR. A current is then injected at the common node NC so as to stabilize the voltage VS at the threshold voltage VR.
    The circuit further comprises determination means 6 configured to determine the current Is consumed at the output terminal BS from the first potential difference (at the terminals of RI) if this first potential difference is less than said voltage drop. maximum admissible Vd and from the second potential difference (across R2) if the first potential difference (across RI) is greater than or equal to said maximum allowable voltage drop Vd.
    More precisely in this exemplary embodiment, the determination means comprise two analog / digital converters CAN1, CAN2 respectively connected at the output of the first measurement means 1 and of the second measurement means 2, and a processing module MDT, for example a microprocessor , configured to compare the output of the first measuring means with said maximum admissible voltage drop Vd and to select the samples delivered by the corresponding converter as a function of the result of said comparison.
    More specifically, as illustrated in FIG. 2, the two outputs of the two amplifiers 10 and 20 are sampled simultaneously.
    If the MDT processing module finds that the potential difference across the terminals of the first resistor RI is less than Vd (i.e. if the current drawn is low, here less than 100 microamps), then these are the samples from the CAN1 converter which are selected by the MDT processing module to determine the value of the current consumed Is (Figure 2). And in this case no current is injected at the common node NC.
    If on the contrary as illustrated in FIG. 3, the processing module MDT notes that the potential difference across the terminals of the first resistance RI is greater than Vd (that is to say if the current drawn is strong, here greater than 100 microamps), then it is the samples from the CAN2 converter which are selected by the MDT processing module to determine the value of the current consumed Is. And in this case a current is only injected at the common node
    NC to stabilize the output voltage VS at the threshold voltage VR.
    It is then possible to retrieve the values determined by the microprocessor 6 using a computer, for example using a USB link (not shown).
    权利要求:
    Claims (11)
    [1" id="c-fr-0001]
    1. Method for determining the value of a current (I s ) consumed by an active load (UT) supplied by a first voltage source (VI), in which
    - there is a first resistor (RI) and a second resistor (R2) in series between the voltage source (SI) and a first terminal (Bl) of the active load (UT), the first resistor (RI) being of value greater than the second resistance (R2),
    - a maximum admissible voltage drop (Vd) at the terminals of the first resistor is defined and, if the voltage at the first terminal (Bl) is less than a threshold value (VR) equal to the value of the voltage (VI) delivered by said first voltage source (SI) minus said admissible voltage drop (Vd), the voltage (VS) is stabilized at the first terminal (Bl) of the active load at said threshold value (VR),
    a first potential difference across the first resistor (RI) and a second potential difference across the second resistor (R2) is simultaneously measured,
    - if the first potential difference is less than said maximum admissible voltage drop (Vd), the value of the current consumed (Is) is determined from the first potential difference
    - And if the voltage is greater than or equal to said maximum allowable voltage drop (Vd), the value of the current consumed (Is) is determined from the second potential difference.
    [2" id="c-fr-0002]
    2. Method according to claim 1, in which the voltage (VS) is stabilized at the first terminal (Bl) of the active load by comparing said voltage (VS) with said threshold value (VR) and by injecting at the node (NC) common to the two resistors (RI, R2) a current proportional to the difference between the threshold value (VR) and the value of said voltage (VS).
    [3" id="c-fr-0003]
    3. Method according to one of the preceding claims, in which the ratio between the value of the first resistance (RI) and the value of the second resistance (R2) is between 100 and 1000.
    [4" id="c-fr-0004]
    4. Method according to one of the preceding claims, wherein the active load comprises a processing unit (UT).
    [5" id="c-fr-0005]
    5. Electronic circuit, comprising an input terminal (BE) intended to be connected to a first voltage source (SI), an output terminal (BS) intended to be connected to an active load (UT) and means for processing configured to determine a current consumed (I s ) at said output terminal, the processing means comprising
    a first resistor (RI) and a second resistor (R2) connected in series between the input terminal (BE) and the output terminal (BS), the first resistor (RI) being of value greater than the second resistor ( R2),
    - first measurement means (1) and second measurement means (2) respectively configured to simultaneously measure a first potential difference across the first resistance (RI) and a second potential difference across the second resistance ( R2),
    - stabilization means (3) configured to stabilize the voltage at the output terminal at a threshold value equal to the value of the voltage delivered by said first voltage source minus a maximum admissible voltage drop across the terminals of the first resistance, if the voltage at the output terminal is less than said threshold voltage, and
    - determination means (6) configured to determine the current consumed at the output terminal from the first potential difference if the first potential difference is less than said maximum admissible voltage drop and from the second difference potential if the first potential difference is greater than or equal to said maximum allowable voltage drop.
    [6" id="c-fr-0006]
    6. The electronic circuit as claimed in claim 5, in which the stabilization means (3) comprise comparison means (5) configured to compare said voltage present at the output terminal with said threshold value and additional means (50) configured to injecting into the node common to the two resistors a current proportional to the difference between the value of the voltage present at the output terminal and said threshold value.
    [7" id="c-fr-0007]
    7. The electronic circuit as claimed in claim 6, in which the comparison means comprise a differential amplifier (5) whose inverting input is connected to the output terminal (BS), whose non-inverting input is intended to receive said value. threshold (VR), the additional means include a transistor (TR), the control electrode of which is coupled to the output of the differential amplifier (5), of which a first conduction electrode is connected to an additional voltage source (S3 ) and of which a second conduction electrode is coupled to said common node (NC) with the two resistors (RI, R2), and the differential amplifier (5) is configured for, when the voltage present at the output terminal (BS) is greater than or equal to the threshold voltage (VR), delivering an output voltage leading to a blocking of said transistor (TR).
    [8" id="c-fr-0008]
    8. Electronic circuit according to claim 5, 6 or 7, wherein the ratio between the value of the first resistance (RI) and the value of the second resistance (R2) is between 100 and 1000.
    [9" id="c-fr-0009]
    9. Electronic circuit according to one of claims 5 to 8, in which
    the first measurement means (1) comprise a first operational amplifier (10) whose inputs are coupled to the terminals of the first resistor (RI),
    - The second measurement means (2) comprise a second operational amplifier (20) whose inputs are coupled to the terminals of the second resistor (R2).
    - and
    - the means of determination comprise two
    5 analog / digital converters (CAN1, CAN2) respectively connected to the output of the first and second measurement means (1, 2), and a processing module (MDT) configured to compare the output of the first measurement means with said voltage drop
    [10" id="c-fr-0010]
    10 maximum admissible (Vd) and to select the samples delivered by the corresponding converter according to the result of said comparison.
    10. Electronic circuit according to one of claims 5 to 9, in which the output terminal is intended to be
    [11" id="c-fr-0011]
    15 connected to a processing unit (UT) forming said active load.
    1/2
    MDT CAN2 CE
    类似技术:
    公开号 | 公开日 | 专利标题
    FR3056299A1|2018-03-23|METHOD FOR DETERMINING THE CONSUMPTION OF AN ACTIVE CHARGE, FOR EXAMPLE A PROCESSING UNIT, AND AN ELECTRONIC CIRCUIT
    FR3056035A1|2018-03-16|METHOD AND SYSTEM FOR MANAGING THE POWER SUPPLY VOLTAGE OF A TYPE C USB SOURCE DEVICE
    EP2302341A2|2011-03-30|Detection circuit with improved anti-blooming circuit
    JP2009283845A|2009-12-03|Apparatus for evaluating output characteristic of solar battery, and method for evaluating output characteristic of solar battery
    FR2820506A1|2002-08-09|METHOD FOR MEASURING CAPACITOR CAPACITY
    EP1857906A1|2007-11-21|Linear voltage regulator and method of limiting the current in such a regulator
    FR2471708A1|1981-06-19|POWER SUPPLY CIRCUIT HAVING EARTH SHORT CIRCUIT DETECTION FUNCTION FOR TELECOMMUNICATION SYSTEM
    EP2600125B1|2016-04-20|Radiation-detection device with improved illumination range
    FR2756984A1|1998-06-12|EMERGENCY POWER SUPPLY TEMPORARILY FOR A DEFICIENCY OF A MAIN POWER SOURCE
    FR3065290A1|2018-10-19|LOW SHIFT CURRENT DETECTION AMPLIFIER
    FR3071318A1|2019-03-22|DETECTION OF DISTURBANCES OF A CONTINUOUS VOLTAGE
    EP2722727A1|2014-04-23|Supply of a floating potential charge
    JP5186546B2|2013-04-17|Photoelectric conversion circuit
    EP2950435A1|2015-12-02|Electronic device including a very-low-voltage power generator supplying a battery
    FR3066277A1|2018-11-16|DEVICE AND METHOD FOR DETECTING AN ELECTRICAL CHARGE
    FR3075518A1|2019-06-21|SWITCHING CIRCUIT
    EP3104143B1|2018-08-01|System comprising a photovoltaic cell and a device for measuring light intensity, and method for measuring a light intensity received by said photovoltaic cell
    EP2830215B1|2016-03-23|Load preamplifier
    WO2012062789A1|2012-05-18|Current measurement for an electric heater
    EP1630533B1|2011-10-05|Temperature measurement device in a thermal energy meter
    FR3037722A1|2016-12-23|METHOD FOR READING AN ELECTRONIC MEMORY DEVICE
    EP3451181A1|2019-03-06|Circuit for protecting against high voltages for usb type c receiver
    EP2491415B1|2014-02-12|Device for measuring battery voltage and related monitoring device
    EP1487106A1|2004-12-15|Integrated circuit producing power supply independent logic levels without regulators in the power section and a corresponding communication module.
    EP3185389B1|2020-12-02|Device and electrical apparatus for generating an electric voltage to an information processing unit, associated information processing electronic system
    同族专利:
    公开号 | 公开日
    CN107831815B|2020-06-09|
    FR3056299B1|2018-10-19|
    US20180080960A1|2018-03-22|
    CN207319096U|2018-05-04|
    US10634705B2|2020-04-28|
    CN107831815A|2018-03-23|
    引用文献:
    公开号 | 申请日 | 公开日 | 申请人 | 专利标题
    US6255842B1|1997-12-02|2001-07-03|Advantest Corporation|Applied-voltage-based current measuring method and device|
    US20020015319A1|2000-07-28|2002-02-07|Alexandru Hartular|Transient control for converter power supplies|
    US20090179652A1|2008-01-16|2009-07-16|Advantest Corporation|Power supply circuit and test apparatus|
    EP2908417A1|2014-02-13|2015-08-19|Dialog Semiconductor Limited|High speed regulator with low capacitor values|
    EP3007351A2|2014-10-06|2016-04-13|ACS Motion Control Ltd.|Motor servo-drive for high performance motion control|
    CN204832328U|2015-06-12|2015-12-02|武汉精测电子技术股份有限公司|Current detection system|
    CN1109896C|1997-12-02|2003-05-28|株式会社爱德万测试|Method of measuring current while applying a voltage and apparatus therefor|
    DE10393854T5|2002-12-11|2007-03-29|Advantest Corp.|Current measuring device with impressed voltage and current buffer used with switches|
    WO2010068223A1|2008-12-13|2010-06-17|Hewlett-Packard Development Company, L.P.|Systems and methods for scaling a signal in a power factor correction circuit|
    US20170271975A1|2016-03-15|2017-09-21|Semiconductor Components Industries, Llc|Temporary energy storage for voltage supply interruptions|
    FR3056299B1|2016-09-16|2018-10-19|STMicroelectronics SAS|METHOD FOR DETERMINING THE CONSUMPTION OF AN ACTIVE CHARGE, FOR EXAMPLE A PROCESSING UNIT, AND AN ELECTRONIC CIRCUIT|FR3056299B1|2016-09-16|2018-10-19|STMicroelectronicsSAS|METHOD FOR DETERMINING THE CONSUMPTION OF AN ACTIVE CHARGE, FOR EXAMPLE A PROCESSING UNIT, AND AN ELECTRONIC CIRCUIT|
    US10972063B2|2018-10-17|2021-04-06|Analog Devices Global Unlimited Company|Amplifier systems for measuring a wide range of current|
    US10914780B2|2018-12-20|2021-02-09|Micron Technology, Inc.|Methods and apparatuses for threshold voltage measurement and related semiconductor devices and systems|
    CN110174545A|2019-04-30|2019-08-27|上海芯导电子科技有限公司|A kind of multiplexing current detection circuit|
    法律状态:
    2017-08-21| PLFP| Fee payment|Year of fee payment: 2 |
    2018-03-23| PLSC| Search report ready|Effective date: 20180323 |
    2018-08-22| PLFP| Fee payment|Year of fee payment: 3 |
    2019-08-20| PLFP| Fee payment|Year of fee payment: 4 |
    2020-08-19| PLFP| Fee payment|Year of fee payment: 5 |
    2021-08-19| PLFP| Fee payment|Year of fee payment: 6 |
    优先权:
    申请号 | 申请日 | 专利标题
    FR1658679|2016-09-16|
    FR1658679A|FR3056299B1|2016-09-16|2016-09-16|METHOD FOR DETERMINING THE CONSUMPTION OF AN ACTIVE CHARGE, FOR EXAMPLE A PROCESSING UNIT, AND AN ELECTRONIC CIRCUIT|FR1658679A| FR3056299B1|2016-09-16|2016-09-16|METHOD FOR DETERMINING THE CONSUMPTION OF AN ACTIVE CHARGE, FOR EXAMPLE A PROCESSING UNIT, AND AN ELECTRONIC CIRCUIT|
    US15/451,495| US10634705B2|2016-09-16|2017-03-07|Method for determining the current consumption of an active load, for example a processing unit, and associated electronic device|
    CN201710161201.3A| CN107831815B|2016-09-16|2017-03-17|Method for determining the current consumption of an active load and related electronic circuit|
    CN201720269257.6U| CN207319096U|2016-09-16|2017-03-17|Electronic circuit|
    [返回顶部]